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Updated: Jul 12, 2026

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy
11:03

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy

Published on: July 14, 2022

固体や表面のイオンビームスペクトロスコーピー

B J Garrison, N Winograd

    Science (New York, N.Y.)
    |May 21, 1982
    PubMed
    まとめ

    イオンビームは,材料科学のための繊細な表面分析を提供します. 二次離子質量スペクトロメトリを用いた新しい方法により,詳細な分子およびタンパク質構造の分析が可能である.

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