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関連する概念動画

Atomic Absorption Spectroscopy: Radiation and Light Sources01:13

Atomic Absorption Spectroscopy: Radiation and Light Sources

Atomic absorption spectroscopy (AAS) relies on the Beer-Lambert law, which requires that the radiation source emits a narrow range of wavelengths to match the absorption characteristics of the analyte atom. The primary criteria for choosing an appropriate radiation source in AAS is to provide a precise and intense emission at specific wavelengths that will allow accurate detection of the analyte.
Two common narrow-range 'line' sources used in AAS are hollow-cathode lamps (HCLs) and...
X-ray Imaging01:24

X-ray Imaging

German physicist Wilhelm Röntgen (1845–1923) was experimenting with electrical current when he discovered that a mysterious and invisible "ray" would pass through his flesh but leave an outline of his bones on a screen coated with a metal compound. In 1895, Röntgen made the first durable record of the internal parts of a living human: an "X-ray" image (as it came to be called) of his wife’s hand. Scientists worldwide quickly began their own experiments with X-rays, and by 1900, X-ray was widely...
Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.
Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.
Photoluminescence: Applications01:14

Photoluminescence: Applications

Photoluminescence offers a wide range of applications due to its inherent sensitivity and selectivity. This technique allows for both direct and indirect analyses of the analyte. Direct quantitative analysis is possible when the analyte exhibits a favorable quantum yield for fluorescence or phosphorescence. However, an indirect analysis may be feasible if the analyte is not fluorescent or phosphorescent, or if the quantum yield is unfavorable. Indirect methods include reacting the analyte with...
X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...

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関連する実験動画

Updated: Jul 11, 2026

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
08:46

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages

Published on: April 13, 2016

新しい光で見る:シンクロトロン放射線

R E Watson, M L Perlman

    Science (New York, N.Y.)
    |March 24, 1978
    PubMed
    まとめ

    シンクロトロン光は,そのユニークな特性により,研究と技術における多用途のアプリケーションを提供しています. その幅広いスペクトルは,スペクトル検査,顕微鏡検査,および材料科学における高度な技術を可能にし,イノベーションを推進します.

    科学分野:

    • 物理や材料科学の原理を利用しています.
    • 先進的なスペクトロスコーピー,顕微鏡,および分散技術を利用しています.

    背景:

    • シンクロトロン光は,研究と技術的なアプリケーションの増加を促すユニークな特性を持っています.
    • シンクロトロン放射線の幅広いスペクトルは紫外線から柔らかいX線領域に及ぶ.

    研究 の 目的:

    • シンクロトロン放射線とその源の特徴を記述する.
    • シンクロトロン源の汎用性を示す典型的な調査とアプリケーションを提示する.

    主な方法:

    • 紫外線領域における原子,分子,固体スペクトロスコピーの探査.
    • 柔らかいX線をスペクトロスコピー,リトグラフィー,顕微鏡,地形学に応用する.
    • より短い波長での散乱特性を利用して,材料の構造を調査する.

    主要な成果:

    • さまざまな科学分野におけるシンクロトロン光の多様な応用を実証する.
    • 複雑な調査のためのシンクロトロン放射線の適応性を強調しています.

    結論:

    • シンクロトロン光は,科学的発見と技術的進歩のための強力で汎用的なツールです.
    • そのユニークな性質は,幅広い最先端の研究方法論を容易にする.

    さらに関連する動画

    Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography
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    Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography

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    Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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    Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

    Published on: June 19, 2018

    関連する実験動画

    Last Updated: Jul 11, 2026

    Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
    08:46

    Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages

    Published on: April 13, 2016

    Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography
    08:51

    Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography

    Published on: May 27, 2008

    Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
    10:12

    Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

    Published on: June 19, 2018