Jove
Visualize
お問い合わせ
JoVE
x logofacebook logolinkedin logoyoutube logo
JoVEについて
概要リーダーシップブログJoVEヘルプセンター
著者向け
出版プロセス編集委員会範囲と方針査読よくある質問投稿
図書館員向け
推薦の声購読アクセスリソース図書館諮問委員会よくある質問
研究
JoVE JournalMethods CollectionsJoVE Encyclopedia of Experimentsアーカイブ
教育
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab Manual教員リソースセンター教員サイト
利用規約
プライバシーポリシー
ポリシー

関連する概念動画

Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Preparation of Samples for Electron Microscopy01:20

Preparation of Samples for Electron Microscopy

To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...

こちらも読む

関連記事

共著者、ジャーナル、引用グラフによってこの研究に関連する記事。

並び替え
Same author

Atomic-scale evidence for displacive disorder in bismuth zinc niobate pyrochlore.

Ultramicroscopy·2018
Same author

Atomic resolution imaging of YAlO<sub>3</sub>: Ce in the chromatic and spherical aberration corrected PICO electron microscope.

Ultramicroscopy·2017
Same author

In quest of perfection in electron optics: a biographical sketch of Harald Rose on the occasion of his 80th birthday.

Ultramicroscopy·2015
Same author

Direct observation of continuous electric dipole rotation in flux-closure domains in ferroelectric Pb(Zr,Ti)O₃.

Science (New York, N.Y.)·2011
Same author

Electron microscopy: The challenges of graphene.

Nature materials·2011
Same author

Negative spherical aberration ultrahigh-resolution imaging in corrected transmission electron microscopy.

Philosophical transactions. Series A, Mathematical, physical, and engineering sciences·2009

関連する実験動画

Updated: Jul 3, 2026

Determining the Mechanical Strength of Ultra-Fine-Grained Metals
05:04

Determining the Mechanical Strength of Ultra-Fine-Grained Metals

Published on: November 22, 2021

偏差修正伝送電子顕微鏡による原子構造の研究

Knut W Urban1

  • 1Institute of Solid State Research and Ernst Ruska Center for Microscopy and Spectroscopy with Electrons, Helmholtz Research Center Jülich, D 52425 Jülich, Germany. k.urban@fz-juelich.de

Science (New York, N.Y.)
|July 26, 2008
PubMed
まとめ
この要約は機械生成です。

偏差修正伝送電子顕微鏡は,材料科学にとって前例のない原子スケールの解像度を提供します. この進歩は,ナノテクノロジーのアプリケーションにとって極めて重要なナノ材料の詳細な特徴づけを可能にします.

さらに関連する動画

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
08:04

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography

Published on: March 12, 2017

Picometer-Precision Atomic Position Tracking through Electron Microscopy
15:04

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

関連する実験動画

Last Updated: Jul 3, 2026

Determining the Mechanical Strength of Ultra-Fine-Grained Metals
05:04

Determining the Mechanical Strength of Ultra-Fine-Grained Metals

Published on: November 22, 2021

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
08:04

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography

Published on: March 12, 2017

Picometer-Precision Atomic Position Tracking through Electron Microscopy
15:04

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

科学分野:

  • 凝縮物質物理学 凝縮物質物理学
  • マテリアルサイエンス 材料科学
  • ナノサイエンス ナノ科学
  • ナノテクノロジー ナノテクノロジー

背景:

  • 伝送電子顕微鏡 (TEM) は,75年間,重要なツールとなっています.
  • 電子光学の進歩は,材料の特徴化の限界を押し上げる上で極めて重要です.

研究 の 目的:

  • TEMにおける偏差修正電子光学の能力を紹介し,強調する.
  • これらの進歩が原子規模の材料分析に与える影響を実証する.

主な方法:

  • 新しい世代の偏差修正伝送電子顕微鏡を使用しています.
  • 電子エネルギーフィルターと電子エネルギー損失スペクトロメーターを使用して,包括的な分析を行う.

主要な成果:

  • 材料の研究で原子規模の解像度を達成した.
  • 高精度で元素組成と化学結合の特徴づけを可能にしました.
  • 数ピコメーターの空間測定精度と~100meVのエネルギー解像度に達しました.

結論:

  • 偏差修正TEMは顕微鏡学における大きな飛躍を表しています.
  • これらの機器は,ナノ科学が要求する原子スケールの特徴付けに不可欠です.
  • 結果を解釈するには,高度な量子力学コンピュータシミュレーションが必要です.