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Updated: Jun 18, 2026

Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene
08:44

Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene

Published on: August 22, 2017

収束ビーム超高速電子顕微鏡で観測された4Dナノスケール difrraction

Aycan Yurtsever1, Ahmed H Zewail

  • 1Physical Biology Center for Ultrafast Science and Technology, Arthur Amos Noyes Laboratory of Chemical Physics, California Institute of Technology, Pasadena, CA 91125, USA.

Science (New York, N.Y.)
|November 11, 2009
PubMed
まとめ

この研究では,時間解像度の向上のために,収束ビーム超高速電子顕微鏡 (CB-UEM) を使用した四次元 (4D) ナノスケール difraktion を導入します. この技術は,ナノスケールでの材料の超高速構造動態の詳細な分析を可能にします.

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Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

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Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope10:25

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope

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