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Updated: May 9, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

電子の形状の測定が改善されました

J J Hudson1, D M Kara, I J Smallman

  • 1Centre for Cold Matter, Blackett Laboratory, Imperial College London, Prince Consort Road, London SW7 2AZ, UK.

Nature
|May 27, 2011
PubMed
まとめ

科学者たちは,電子電極二極モメント (EDM) を探し,標準モデルを超えた新しい物理学の兆候である. 実験では,電子のEDMの証拠は見つかりませんでしたが,電子は前例のない精度で球状であることを示しています.

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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

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Picometer-Precision Atomic Position Tracking through Electron Microscopy15:04

Picometer-Precision Atomic Position Tracking through Electron Microscopy

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