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In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
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電子がトンネルバリアを脱出する時間を解く.

Dror Shafir1, Hadas Soifer, Barry D Bruner

  • 1Department of Physics of Complex Systems, Weizmann Institute of Science, Rehovot 76100, Israel.

Nature
|May 19, 2012
PubMed
まとめ

研究者は,探査レーザーを使用して,電子トンネリングの出口時間を測定しました. このブレークスルーは,超高速科学とアット秒実験に不可欠なトンネル掘削後の電子動態を正確に追跡します.

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