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Updated: May 6, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

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二次元物質との一次元的な電気的接触は,二次元的な物質との二次元的な電気的接触です

L Wang1, I Meric, P Y Huang

  • 1Department of Electrical Engineering, Columbia University, New York, NY 10027, USA.

Science (New York, N.Y.)
|November 2, 2013
PubMed
まとめ

研究者らは,二次元 (2D) 材料のための新しいエッジコンタクト方法を開発し,高度な電子機器のためのグラフェンヘテロ構造の電気コンタクトを改善しました.

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