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関連する概念動画

X-ray Crystallography02:18

X-ray Crystallography

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The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
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X-ray Imaging01:24

X-ray Imaging

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German physicist Wilhelm Röntgen (1845–1923) was experimenting with electrical current when he discovered that a mysterious and invisible "ray" would pass through his flesh but leave an outline of his bones on a screen coated with a metal compound. In 1895, Röntgen made the first durable record of the internal parts of a living human: an "X-ray" image (as it came to be called) of his wife’s hand. Scientists worldwide quickly began their own experiments with...
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X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

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X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal...
3.8K
Determination of Crystal Structures01:29

Determination of Crystal Structures

135
In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
135
Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

11.0K
Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.
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IR Spectrometers01:25

IR Spectrometers

3.1K
There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...
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Fabrication Procedures and Birefringence Measurements for Designing Magnetically Responsive Lanthanide Ion Chelating Phospholipid Assemblies
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X線二重断裂画像処理によるX線画像処理

Benjamin A Palmer1, Gregory R Edwards-Gau1, Benson M Kariuki1

  • 1School of Chemistry, Cardiff University, Park Place, Cardiff CF10 3AT, Wales.

Science (New York, N.Y.)
|May 31, 2014
PubMed
まとめ
この要約は機械生成です。

X線二反射成像 (XBI) は,光学顕微鏡と同様に,X線二反射を検出することによって,物質構造をマッピングします. このテクニックは,アニゾトロプ的固体における分子指向,相変化,およびドメイン構造を明らかにします.

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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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Fabrication Procedures and Birefringence Measurements for Designing Magnetically Responsive Lanthanide Ion Chelating Phospholipid Assemblies
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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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科学分野:

  • マテリアルサイエンス 材料科学
  • 凝縮物質物理学 凝縮物質物理学
  • クリスタログラフィーです.

背景:

  • 極性光学顕微鏡は,長い間,光学二重断裂を通して物質アニソトロピーを研究してきました.
  • X線二反射は,近年の現象で,アニゾトロプ的固体における分子/結合方向性に敏感である.

研究 の 目的:

  • 偏光光学顕微鏡のX線アナログであるX線二反射成像 (XBI) を導入する.
  • 材料におけるX線二反射の空間的に解明されたマッピングのためのXBIの能力を実証する.

主な方法:

  • X線バイフレンゲンスイメージング (XBI) 技術の開発と応用.
  • アニゾトロプ的物質におけるX線二重断裂現象の空間解析マッピング.

主要な成果:

  • XBIは,アニゾトロプ材料の局所的な指向特性を成功裏にマッピングしています.
  • 固体相変遷中の分子指向順序の変化の特徴化.
  • ドメイン構造のサイズ,分布,および温度依存性の識別.

結論:

  • XBIは,局所的な指向特性をイメージするための強力で敏感な技術です.
  • XBIは,フェーズトランジションやドメインダイナミクスを含む材料の行動に関する新しい洞察を提供します.