Jove
Visualize
お問い合わせ
JoVE
x logofacebook logolinkedin logoyoutube logo
JoVEについて
概要リーダーシップブログJoVEヘルプセンター
著者向け
出版プロセス編集委員会範囲と方針査読よくある質問投稿
図書館員向け
推薦の声購読アクセスリソース図書館諮問委員会よくある質問
研究
JoVE JournalMethods CollectionsJoVE Encyclopedia of Experimentsアーカイブ
教育
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab Manual教員リソースセンター教員サイト
利用規約
プライバシーポリシー
ポリシー

関連する概念動画

Electrostatic Boundary Conditions01:16

Electrostatic Boundary Conditions

1.2K
Consider an external electric field propagating through a homogeneous medium. When the electric field crosses the surface boundary of the medium, it undergoes a discontinuity. The electric field can be resolved into normal and tangential components. The amount by which the field changes at any boundary is given by the difference between the field components above and below the surface boundary.
The surface integral of an electric field is given by Gauss's law in integral form and is related to...
1.2K
Electric Field at the Surface of a Conductor01:26

Electric Field at the Surface of a Conductor

5.8K
Consider a conductor in electrostatic equilibrium. The net electric field inside a conductor vanishes, and extra charges on the conductor reside on its outer surface, regardless of where they originate.
In the 19th century, Michael Faraday conducted the famous ice pail experiment to prove that the charges always reside on the surface of a conductor. The experimental set-up consists of a conducting uncharged container mounted on an insulating stand. The outer surface of the container is...
5.8K
Electric Field Inside a Conductor01:20

Electric Field Inside a Conductor

8.2K
When a conductor is placed in an external electric field, the free charges in the conductor redistribute and very quickly reach electrostatic equilibrium. The resulting charge distribution and its electric field have many interesting properties, which can be investigated with the help of Gauss's law.
Suppose a piece of metal is placed near a positive charge. The free electrons in the metal are attracted to the external positive charge and migrate freely toward that region. This region then...
8.2K
Electric Field of Two Equal and Opposite Charges01:30

Electric Field of Two Equal and Opposite Charges

7.6K
Atoms generally contain the same number of positively and negatively charged particles, protons, and electrons. Hence, they are electrically neutral. However, the centers of the positive and negative charges do not always coincide. In such a scenario, the electric field of an atom may not be zero.
A separation of the positive and negative charges can lead to a weak, remnant effect of the positive and negative charges. The expectation is that the more the distance between the positive and...
7.6K
Electric Field Lines01:25

Electric Field Lines

11.5K
The three-dimensional representation of the electric field of a positive point charge requires tracing the electric field vectors, whose lengths decrease as the square of their distance from the charge and which point away from the charge at each point. This vector field is no doubt challenging to visualize. The visualization of electric fields becomes quickly intractable as the number of charges increases.
The solution to this problem is to use electric field lines, which are not vectors but...
11.5K
Induced Electric Fields01:23

Induced Electric Fields

5.1K
The fact that emfs are induced in circuits implies that work is being done on the conduction electrons in the wires. What can possibly be the source of this work? We know that it’s neither a battery nor a magnetic field, as a battery does not have to be present in a circuit where current is induced, and magnetic fields never do any work on moving charges. The source of the work is in fact an electric field that is induced in the wires. For example, if a stationary conductor is placed in a...
5.1K

こちらも読む

関連記事

共著者、ジャーナル、引用グラフによってこの研究に関連する記事。

並び替え
Same author

Amplified chiroptic response in a multi-helical penta-perylene structure.

Chemical science·2026
Same author

Designing effective single-molecule electromagnets with radially π-conjugated carbon structures.

Nature communications·2026
Same author

Captodative Radicals Enable the Coexistence of Monomer and Dimer Single-Molecule Junctions with 100-Fold Difference in Conductance.

Journal of the American Chemical Society·2026
Same author

Acid-Catalyzed Rearrangement Reaction for Single-Molecule Junction Formation.

Chemistry (Weinheim an der Bergstrasse, Germany)·2026
Same author

Scanning Tunneling Microscope-Based Break-Junction TechniqueA Tutorial.

ACS physical chemistry Au·2026
Same author

A Computationally Efficient and Accurate Method for Predicting Conductance of Single-Molecule Junctions.

Nano letters·2026
Same journal

Linker Engineering toward NIR-II Metal-Organic Framework with Maximal Emission beyond 1000 nm for Inflammatory Bowel Disease Imaging.

Journal of the American Chemical Society·2026
Same journal

Observing Kinetic Selectivity in Anthracene Photodimerization through Selective Quenching by Excited States of Proximate Rare Earth Cations.

Journal of the American Chemical Society·2026
Same journal

Sequence-Dependent Folding of Recognition-Encoded Melamine Oligomers.

Journal of the American Chemical Society·2026
Same journal

Large Thermo- and Mechanosalient Actuation via Cooperative Twist Elasticity-Induced Packing Motif Conversion.

Journal of the American Chemical Society·2026
Same journal

Discovery and Biosynthesis of Lanthipeptides Featuring an Azepinoindole Scaffold by Radical <i>S</i>-Adenosylmethionine Enzyme-Catalyzed C-C Bond Formation.

Journal of the American Chemical Society·2026
Same journal

Enantiopurity-Controlled Magnetism in a Two-Dimensional Organic-Inorganic Material.

Journal of the American Chemical Society·2026
関連記事をすべて見る

関連する実験動画

Updated: Apr 17, 2026

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
09:26

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices

Published on: June 26, 2015

9.4K

単一分子の交差点における電場分解

Haixing Li1, Timothy A Su1, Vivian Zhang1

  • 1†Department of Applied Physics and Applied Mathematics and ‡Department of Chemistry, Columbia University, New York, New York 10027, United States.

Journal of the American Chemical Society
|February 13, 2015
PubMed
まとめ
この要約は機械生成です。

この研究は,電圧バイアスが分子結合の安定性にどのように影響するかを明らかにしています. 協和結合は強固であり,ドナー-受容体結合とSi-Si/Ge-Ge結合は電圧下で破裂し,Si-C骨格が最も安定性を示しています.

さらに関連する動画

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
06:58

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization

Published on: July 12, 2016

10.1K
Single-Molecule F&#246;rster Resonance Energy Transfer Methods for Real-Time Investigation of the Holliday Junction Resolution by GEN1
11:27

Single-Molecule Förster Resonance Energy Transfer Methods for Real-Time Investigation of the Holliday Junction Resolution by GEN1

Published on: September 18, 2019

10.1K

関連する実験動画

Last Updated: Apr 17, 2026

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
09:26

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices

Published on: June 26, 2015

9.4K
Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
06:58

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization

Published on: July 12, 2016

10.1K
Single-Molecule F&#246;rster Resonance Energy Transfer Methods for Real-Time Investigation of the Holliday Junction Resolution by GEN1
11:27

Single-Molecule Förster Resonance Energy Transfer Methods for Real-Time Investigation of the Holliday Junction Resolution by GEN1

Published on: September 18, 2019

10.1K

科学分野:

  • マテリアルサイエンス 材料科学
  • ナノテクノロジー ナノテクノロジー
  • 表面化学について

背景:

  • 分子結合の安定性を理解することは,分子電子工学にとって極めて重要です.
  • 高電圧バイアスは,分子結合の破裂を誘導する可能性があります.
  • 結合の安定性における分子骨格とリンカー群の役割については,さらなる調査が必要である.

研究 の 目的:

  • 単一分子/単一結合レベルでの高電圧バイアスの下での分子結合の安定性と破裂を調査する.
  • 分子幹の組成 (炭素,シリコン,ゲルマーニウム) とリンカー群が電圧誘発の交差点破裂にどのように影響するかを決定する.
  • 単一分子スケールでの電場分解現象を研究するための新しい方法を確立する.

主な方法:

  • スキャニング・トンネリング・顕微鏡ベースのブレイク・ジャンクション・テクニックを利用した.
  • 合成された炭素,シリコン,およびゲルマニウムベースの分子ワイヤには,アオロフィールなリンク器群があります.
  • 適用電圧バイアスの関数として,交差点破裂確率を分析した.

主要な成果:

  • 共同的硫黄金 (S-Au) 結合を持つ結合は,高い強度を示し,バイアス依存の破裂はなかった.
  • ドナー・アクセプター・ボンドの交差点は,より頻繁に破裂し,強いバイアス依存を示した.
  • シリコン-シリコン (Si-Si) とゲルマーニウム-ゲルマーニウム (Ge-Ge) の結合において,メチルチオール末端のディシランおよびディゲルマンで ~1V 以上で破裂確率の有意な増加.
  • シリコン-炭素 (Si-C) バックボンは,シリコン-シリコン (Si-Si) とシリコン-酸素 (Si-O) 結合と比較して,高電圧下でのより高い安定性を示しました.

結論:

  • 高電圧下での分子結合の安定性は,化学結合の種類と分子骨格に大きく依存しています.
  • 協和性S-Au結合は優れた安定性を有しますが,ドナー-受容体および同核結合 (Si-Si,Ge-Ge) は電圧による破裂に敏感です.
  • Si-C結合は,高電場下での分子結合の安定性を高め,頑丈な分子電子装置の可能性を秘めています.