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Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
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光誘導電場による半導体界面キャリアダイナミクス

Ye Yang1, Jing Gu2, James L Young3

  • 1National Renewable Energy Laboratory, Chemistry and Nanoscience Center, Golden, CO, 80401, USA. ye.yang@nrel.gov matt.beard@nrel.gov.

Science (New York, N.Y.)
|November 28, 2015
PubMed
まとめ

半導体界面で電荷の分離がどのように起こるかを明らかにする. この方法では,p-GaInP2/TiO2インターフェースは,効率的な太陽光水分裂のために電荷再結合を減少させます.

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