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X-ray Crystallography02:18

X-ray Crystallography

26.8K
The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
26.8K
X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

5.1K
X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal...
5.1K
Determination of Crystal Structures01:29

Determination of Crystal Structures

69
In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
69
Imperfections in Crystal Structure: Point, Line and Plane Defects01:25

Imperfections in Crystal Structure: Point, Line and Plane Defects

54
A perfect crystal, in theory, has a uniform structure with the same unit cell and lattice points throughout. However, any deviation from this periodic arrangement is known as an imperfection or defect. These defects can be categorized into three types: point, line, and plane defects.Point defects occur when there is a deviation from the ideal due to missing atoms, displaced atoms, or additional atoms. These imperfections might occur due to imperfect packing during crystallization or because of...
54
Imperfections in Crystal Structure: Stoichiometric Point Defects01:26

Imperfections in Crystal Structure: Stoichiometric Point Defects

67
Schottky defects arise when some lattice points in a crystal, such as those in NaCl, remain unoccupied, creating lattice vacancies without disturbing the overall electrical neutrality of the crystal. This defect is common in ionic crystals where the positive and negative ions are similar in size, as seen in sodium chloride and cesium chloride. The presence of Schottky defects enables the crystal to conduct electricity to a small extent through an ionic mechanism. Electric fields cause nearby...
67

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Microcrystallography of Protein Crystals and In Cellulo Diffraction
09:35

Microcrystallography of Protein Crystals and In Cellulo Diffraction

Published on: July 21, 2017

9.6K

不完全結晶を用いたマクロ分子 difrractive イメージング

Kartik Ayyer1, Oleksandr M Yefanov1, Dominik Oberthür2

  • 1Center for Free-Electron Laser Science, DESY, 22607 Hamburg, Germany.

Nature
|February 12, 2016
PubMed
まとめ
この要約は機械生成です。

研究者は不完全な結晶からの連続的微分法を用いて 大分子構造を決定する新しい方法を開発しました この技術はX線結晶学の解像度制限を克服し,光システムIIのようなタンパク質複合体の詳細なイメージングを可能にします.

さらに関連する動画

On-Chip Crystallization and Large-Scale Serial Diffraction at Room Temperature
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On-Chip Crystallization and Large-Scale Serial Diffraction at Room Temperature

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Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography
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Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography

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関連する実験動画

Last Updated: Mar 26, 2026

Microcrystallography of Protein Crystals and In Cellulo Diffraction
09:35

Microcrystallography of Protein Crystals and In Cellulo Diffraction

Published on: July 21, 2017

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On-Chip Crystallization and Large-Scale Serial Diffraction at Room Temperature
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On-Chip Crystallization and Large-Scale Serial Diffraction at Room Temperature

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Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography
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Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography

Published on: April 24, 2018

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科学分野:

  • 構造生物学
  • バイオ物理学
  • クリスタルグラフィー

背景:

  • X線結晶学はマクロ分子構造を決定する鍵です.
  • 高解像度を実現するには 高品質の結晶が不可欠です
  • 結晶の格子障害は結晶解像度を制限する.

研究 の 目的:

  • 不完全な結晶から構造を決定するための連続的屈折パターンの可能性を調査する.
  • X線結晶学におけるブラッグピークによる解像度の制限を克服するために

主な方法:

  • 不完全な結晶からの 連続的屈折パターンを分析する
  • 分散パターンを直接フェージングする.
  • 構造の決定のために分子封筒の制約を使用する.

主要な成果:

  • 光システムIIの結晶の格子障害は,ブラッグピークの4.5アングストロームの限界を超えて情報内容と解像度を高めました.
  • 光システムII二重体の3.5アングストローム解像度構造は,連続 difraktionを用いて得られた.
  • 連続 difraktion を使ってモデルフリーフェーシングを証明した.

結論:

  • 不完全な結晶からの連続的微分は,より高い解像度でマクロ分子構造を決定するために使用できます.
  • この方法は,一般的に遭遇する結晶の不完全性を利用することによって,伝統的なX線結晶学の限界を克服します.
  • 以前のモデルなしで構造の決定を可能にし,マクロ分子構造の解明を進める.