フェルミ弧の準粒子の干渉とウェイル半金属の表面積接続性

Hiroyuki Inoue1, András Gyenis1, Zhijun Wang1

  • 1Joseph Henry Laboratories of Physics, Department of Physics, Princeton University, Princeton, NJ 08540, USA.

Science (New York, N.Y.)
|March 12, 2016
PubMed
まとめ

研究者はスキャニングトンネル顕微鏡を用いて ウェイル半金属の電子の振る舞いを視覚化しました 表面電子輸送のシンクとして作用し 物質の性質に影響する証拠を発見しました

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