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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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アドレス可能な表面を持つ二次元階層半導体

Bonnie Choi1, Kihong Lee1, Anastasia Voevodin1

  • 1Department of Chemistry , Columbia University , New York , New York 10027 , United States.

Journal of the American Chemical Society
|July 20, 2018
PubMed
まとめ

研究者らは,ユニークな表面反応部位を持つ新しい2D半導体を開発しました. これは,材料を損傷することなく化学的機能化を可能にし,高度なアプリケーションのための調整可能な特性を可能にします.

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Metal-Semiconductor Junctions

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