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Picometer-Precision Atomic Position Tracking through Electron Microscopy
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四次元電子顕微鏡によるサブアングストローム解像度の実空間電荷密度イメージング

Wenpei Gao1, Christopher Addiego2, Hui Wang2,3

  • 1Department of Materials Science and Engineering, University of California at Irvine, Irvine, CA, USA.

Nature
|October 15, 2019
PubMed
まとめ

科学者は,クリスタル材料の局所的な電荷密度をマッピングするための新しいリアルスペース画像技術を開発しました. この方法は,ヘテロ構造におけるインターフェイスの電荷蓄積を明らかにし,電子分布を研究するための電子顕微鏡を前進させる.

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