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Yonggang Yao1, Caijin Xiao1, Pingsheng Wang1

  • 1Department of Nuclear Physics, China Institute of Atomic Energy, Beijing 102413, China.

Journal of the American Chemical Society
|March 17, 2022
PubMed
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ニュートロン活性化分析により, チャンで独特の元素の組成が明らかになった.

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Atomic Force Microscopy01:08

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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