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関連する概念動画

Atomic Emission Spectroscopy: Overview01:20

Atomic Emission Spectroscopy: Overview

2.4K
Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
2.4K
Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

553
The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
553
Atomic Fluorescence Spectroscopy01:29

Atomic Fluorescence Spectroscopy

463
Atomic fluorescence spectroscopy (AFS) is an analytical technique that involves the electronic transitions of atoms in a flame, furnace, or plasma being excited by electromagnetic (EM) radiation. When these atoms absorb energy, they become excited and subsequently release energy as they return to their original state. This emitted light, or "fluorescence," is observed at a right angle to the incident beam. Both absorption and emission processes transpire at distinct wavelengths, which...
463
Atomic Emission Spectroscopy: Lab01:29

Atomic Emission Spectroscopy: Lab

221
AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
221
Atomic Emission Spectroscopy: Interference01:30

Atomic Emission Spectroscopy: Interference

244
In atomic emission spectroscopy (AES), high-temperature atomizers excite a broad range of elements and molecules that generate complex emissions from sources such as oxides, hydroxides, and flame combustion products in the flame or plasma. Several strategies can be employed to minimize spectral interferences caused by overlapping emission lines or bands. These include increasing instrument resolution, choosing alternative emission lines, optimally placing the detector in low-background regions,...
244
Atomic Spectroscopy: Absorption, Emission, and Fluorescence01:23

Atomic Spectroscopy: Absorption, Emission, and Fluorescence

1.2K
Atomic spectroscopy is a vital tool in elemental analysis, both qualitatively and quantitatively. It can be broadly divided into optical spectroscopy, mass spectroscopy, and X-ray spectroscopy methods. The optical spectroscopic methods are atomic absorption spectroscopy (AAS), atomic emission spectroscopy (AES), and atomic fluorescence spectroscopy (AFS). The first step in all three methods is atomization, where the solid, liquid, or solution-phase samples are converted into gas-phase atoms and...
1.2K

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Preparing a Celadonite Electron Source and Estimating Its Brightness
09:14

Preparing a Celadonite Electron Source and Estimating Its Brightness

Published on: November 5, 2019

4.6K

アット・セカンド・フィールド・エミッション

H Y Kim1, M Garg2, S Mandal1

  • 1Institut für Physik, Universität Rostock, Rostock, Germany.

Nature
|January 25, 2023
PubMed
まとめ
この要約は機械生成です。

研究者は 強い光のトランジエンスを使って トングステンのナノチップから放出された アット秒の電子パルスを測定しました 電子ダイナミクスをリアルタイムで 画像処理やアット秒物理学で 観測できるようになりました

さらに関連する動画

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

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Femtosecond Laser Filaments for Use in Sub-Diffraction-Limited Imaging and Remote Sensing
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Preparing a Celadonite Electron Source and Estimating Its Brightness
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Preparing a Celadonite Electron Source and Estimating Its Brightness

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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

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Femtosecond Laser Filaments for Use in Sub-Diffraction-Limited Imaging and Remote Sensing
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科学分野:

  • アット秒物理学
  • ナノ光学
  • 電子放出量

背景:

  • 高周波信号処理と原子スケールのイメージングには,フィールド電子放出が不可欠です.
  • 電子顕微鏡の進歩は,サブフェムト秒の閉じ込めとフィールド放出の検査の技術を必要とします.
  • 強いレーザーパルスで ナノ構造の金属から発する光学波を フェムト秒で閉じ込めることができました

研究 の 目的:

  • アット秒の電子パルスを測定するための技術を開発する.
  • リアルタイムで光学フィールドの ダイナミクスを調べる
  • 電子パルスの性質をナノスケールで調べる

主な方法:

  • トングステンナノタイプからの光学場放射を誘導するために,強烈なサブサイクル光トランジタを使用した.
  • 発射ダイナミクスをリアルタイムで探査するために 弱体レプリカを使用した.
  • 時間の長さや鳴き声を含む,再分散された電子パルスの時間的な性質を測定した.

主要な成果:

  • 53 ± 5 アット秒の電子パルスを生成し,測定しました.
  • 電子パルスの鳴き声を特徴づけました
  • ナノスケールでの直接的な探査を提供した.

結論:

  • 電子パルスを測定する能力が示され,これは長年の課題です.
  • この技術は アット秒物理学やナノ光学の研究に 新たな道を開きます
  • 電子のダイナミクスを アットセカンドのスケールで知ることができます