イベント対応スキャニング伝送電子顕微鏡
Jonathan J P Peters1,2,3, Bryan W Reed4, Yu Jimbo5
1Advanced Microscopy Laboratory, CRANN, Trinity College Dublin, The University of Dublin, Dublin, Ireland.
まとめ
この研究は,サンプルからの情報回収を強化するイベント対応電子顕微鏡技術を導入しています. リアルタイムのイベントに基づいて 電子の量を調整することで 放射線に敏感な材料の損傷を最小限にします
科学分野:
- 材料科学
- 顕微鏡検査
- 物理学
背景:
- 伝送電子顕微鏡 (TEM) の高エネルギー電子はサンプル損傷を引き起こし,イメージング能力を制限する.
- 現在のTEM方法は,特定のピクセルまたはサンプルにとって最適なレベルを超えた固定された電子用量をしばしば提供します.
研究 の 目的:
- 電子顕微鏡のためのイベント対応画像アプローチを開発する.
- 電子毎の情報を取得し,全体的な放射線量を減らすために.
- ビームに敏感な材料への適用性を実証する.
主な方法:
- 電子数値の値に達するまでの時間を測定することで,イベント対応イメージング戦略を実装した.
- 電子ビームを動的に遮断した
- 目標のシグナル対ノイズ比率を達成するために,電子の量を適応的に配分する.
主要な成果:
- イベント対応アプローチは,従来の固定用量方法と比較して,電子あたりより多くの情報を得ます.
- 望ましいシグナル/ノイズ比率を達成するには,全体的な電子用量を減らす必要があります.
- 放射線に敏感な生物組織とゼオライト構造を 画像化しました
結論:
- イベント応答性電子顕微鏡は,用量効率の良いイメージングソリューションを提供します.
- この方法は,特に繊細なサンプルの場合,放射線による損傷を大幅に軽減します.
- この技術は,顕微鏡における様々なビーム感受性物質に広く適用できます.
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