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Updated: May 12, 2026

Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities
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Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities

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量子傷はグラフェンに 痕跡を残します

Dmitry Abanin, Maksym Serbyn

    Nature
    |November 28, 2024
    PubMed
    まとめ

    No abstract available in PubMed .

    キーワード:
    材料科学物理学量子物理学

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    関連する概念動画

    Atomic Force Microscopy01:08

    Atomic Force Microscopy

    Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
    The AFM Probe
    The probe is regarded as the heart of any AFM setup and comprises the...