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Iris C G van den Bosch1, Jahid Uz Zaman1, Genrikh Shterk1

  • 1MESA+ Institute for Nanotechnology, Faculty of Science and Technology, University of Twente, Enschede, Netherlands.

Science advances
|August 22, 2025
PubMed
まとめ

この研究では,埋もれたインターフェイスを分析するための三色X線源を備えた,多用途の近環境圧力X線光電子スペクトロスコーピー (NAP-XPS) システムを導入しています. 先進的な設定により,反応条件下での材料の詳細な in situ および operando 試験が可能になります.

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