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Updated: Sep 10, 2025

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
08:46

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages

Published on: April 13, 2016

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高電圧伝送電子顕微鏡を用いたSn-3Ag-0.5Cu/Cu溶接接合体における変形の局所観測

Kazuhiro Nogita1, Xin Fu Tan1, Jiye Zhou1

  • 1Nihon Superior Centre for the Manufacture of Electronic Materials (NS CMEM), School of Mechanical and Mining Engineering, The University of Queensland, St. Lucia, QLD 4072, Australia.

Materials (Basel, Switzerland)
|August 28, 2025
PubMed
まとめ

溶接関節の故障を理解することは,信頼性の高い電子機器にとって極めて重要です. この研究では,Sn−3重%Ag−0.5重%Cu (SAC305) の溶接接合体における微細構造変形および故障メカニズムを観察するためのインシット高電圧伝送電子顕微鏡 (HV-TEM) 方法が導入されます.

キーワード:
Pb のない溶接電子機器の包装高圧伝送電子顕微鏡インサイト変形

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Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...
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