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Updated: May 13, 2026

In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions
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In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions

Published on: June 16, 2014

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ルテニウム複合体とMoS2単層の間の電荷移転の超高速トランジタ s-SNOM ナノスケープ測定

Oliver Hirschmann1, Harsh H Bhakta1, Hao Zhou1

  • 1Department of Chemistry and Biochemistry, University of California San Diego, La Jolla, CA 92093, USA. w2xiong@ucsd.edu.

Chemical communications (Cambridge, England)
|August 29, 2025
PubMed
まとめ

先進的なナノスコーピーを用いて 金属有機複合体とMoS2の エクシトン拡散を測定しました この研究は,光収集装置の効率を高めるための重要な洞察を示しています.

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The Electrical Double Layer01:30

The Electrical Double Layer

In the region where two bulk phases meet, an intricate electric charge distribution arises due to charge transfer, ion adsorption, molecular orientation, and charge distortion. This complex distribution is commonly referred to as the electrical double layer.When a solid electrode interfaces with ions in an electrolyte solution, the speed of electron transfer dictates the rates of oxidation and reduction. The electrode acquires a charge through the escape of atoms into the solution as cations or...