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Updated: May 7, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

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SCP-DETR:PCBの欠陥検出のための効率的な小物強化機能ピラミッドアプローチ

Yuanyuan Wang1, Tongtong Yin1, Xiuchuan Chen1

  • 1College of Computer and Software Engineering, Huaiyin Institute of Technology, Huaian, China.

PloS one
|August 29, 2025
PubMed
まとめ

この研究は,印刷回路板 (PCB) の小さな欠陥を検出するための改良された方法であるSCP-DETRを導入します. SCP-DETRは機能融合を最適化し,特殊なコンボリュションを使用して,欠陥検出性能を大幅に改善します.

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Effects of EDTA on End-Point Detection Methods01:18

Effects of EDTA on End-Point Detection Methods

Different methods, such as visual observance of metal-ion indicators, spectroscopic techniques, and potentiometric methods, can determine the endpoint of an EDTA titration.
In the visual method, metal-ion indicators (metallochromic dyes), which have distinct colors in their free and complex forms, are added to the mixture to signal the titration's end point. They form stable complexes with metal ions, but these complexes are weaker than the corresponding metal–EDTA complexes. As a...
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