ポハン軽陽子線源IIにおけるコヒーレントX線散乱ビームラインのアップグレード

Daseul Ham¹, Daewoong Nam¹, Changyong Song²

¹Pohang Accelerator Laboratory, POSTECH, Pohang 37673, Republic of Korea.

|December 17, 2025

Abstract:

The Coherent X-ray Scattering beamline at the Pohang Light Source-II was constructed in 2011 for coherent diffraction imaging and has now been upgraded in its focusing optics, diffractometer, detectors and endstation. The enhanced photon flux density and modified endstation have enabled routine Bragg coherent diffraction imaging and microbeam diffraction, while the newly implemented ptychography setup has enhanced nano-imaging capability in transmission geometry. Because coherent diffraction imaging and microbeam diffraction share the same upstream optics, switching between techniques requires only minor adjustments to slit settings, mirror pitch and the sample-to-detector distance, enabling efficient integration of user programs without compromising instrument performance. This paper details the upgrade and the new capabilities of the beamline.

キーワード:

CDI コヒーレントX線散乱ビームライン PLS-II コヒーレント回折イメージングマイクロビーム回折

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