関連する実験動画

Updated: Jan 7, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

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四次元スキャニング伝送電子顕微鏡のデータ分析による自動化された原子位置決定

Francisco Fernandez-Canizares1, Javier Rodriguez-Vazquez1, Rafael V Ferreira1

  • 1GFMC, Departamento de Física de Materiales, Universidad Complutense de Madrid, Madrid, 28040, Spain; Instituto Pluridisciplinar Universidad Complutense de Madrid, 28040, Spain.

Ultramicroscopy
|January 1, 2026
PubMed
まとめ

No abstract available in PubMed .

キーワード:
4D-STEMについて収束ビームの電子 difraktionディープラーニング機械学習スキャニング伝送電子顕微鏡

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Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
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