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Updated: Jan 7, 2026

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イン・シトゥスキャニング伝送電子顕微鏡/伝送電子顕微鏡 CuOナノワイヤベースのメモリストにおける欠陥駆動のAgイオンダイナミクスとフィラメント進化の研究

Ching-Heng Hung1, Chong-Chi Chi2, Kai-Yuan Hsiao1

  • 1Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 300, Taiwan.

ACS applied materials & interfaces
|January 5, 2026
PubMed
まとめ

No abstract available in PubMed .

キーワード:
CuOナノワイヤ導電メカニズム電気化学的金属化プロセスインサイトTEMイオン移動レジスティブスイッチング

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