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Updated: Jan 18, 2026

Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue
Published on: July 6, 2011
ポストモーテムヒト脳組織の固定および染色プロトコル:集束イオンビーム走査型電子顕微鏡法に最適化
Matthew J Maier1, David A Lewis1, Zachary Freyberg2
1University of Pittsburgh, School of Medicine, Department of Psychiatry, Pittsburgh, PA 15213, USA.
Abstract:
Here, we present a protocol for generating postmortem human brain tissue samples suitable for volume electron microscopy (vEM) imaging via focused ion beam-scanning electron microscopy (FIB-SEM). We describe steps for immersion fixation, sectioning, long-term cryopreservation, and enhanced-contrast staining that produce samples suitable for high-resolution FIB-SEM. This approach generates ultrastructure of sufficiently high preservation to enable both dense and targeted three-dimensional (3D) reconstructions of cellular, subcellular, synaptic, and organellar features in postmortem human brain samples. For complete details on the use and execution of this protocol, please refer to Glausier et al.1.
関連する概念動画
Preparation of Samples for Electron Microscopy
Fixation and Sectioning
The simplest type of preparation is the wet mount, in which the specimen is placed in a drop of liquid on the slide. A liquid specimen can be directly deposited on the slide using a dropper. Solid specimens, such as skin scraping, can be placed on the slide before adding a drop of liquid to prepare the wet mount. Sometimes the liquid is simply water, but stains are often added...

