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Updated: Feb 20, 2026

X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells
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マトリックス光学に基づくX線ビームラインシステムの振動評価のための方法

Zhenjiang Xing, Kai Hu, Chuan Yang

    Optics express
    |February 18, 2026
    PubMed
    まとめ

    X線光学における振動は,X線自由電子 (X-FEL) のような光源の安定性に影響を及ぼします. 新しいマトリックス光学の方法は,光学要素の振動がビームの性能を低下させ,ビームラインの設計を助ける方法を迅速に分析します.

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