関連する実験動画

Updated: Jun 9, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

ドーパント原子の位置を特定するためのスペクトロスコピク深さの断面に対するベイジアンアプローチ

Michael Deimetry1, Timothy C Petersen2, Matthew Weyland2,3

  • 1School of Physics and Astronomy, Monash University, Melbourne, Australia.

Journal of microscopy
|February 19, 2026
PubMed
まとめ

電子エネルギー損失スペクトロスコーピー (EELS) による深度セッショニングにより,3D素材のドーパントを特定できます. ベイジアンフレームワークは,実験データとシミュレーションを比較し,解釈の落とし穴を克服することで,精度を向上させます.

キーワード:
ベイジアン推論 (Bayesian inference) とは,ベイジアン推論 (Bayesian inference) とは,ベイジアン推論 (Bayesian inference) とは,ベイジアン推論 (Bayesian inference) とは,ベイジアン推論 (Bayesian inference) とは,ベイジアン推論 (Bayesian inference) とは,コア・ロス・コア・ロス深部セッショニングは深部セッショニングです.ドーパントはドーパントです.電子のエネルギー損失スペクトロスコピーエネルギー濾過コンバージェントビームの電子 difraktion は,エネルギー濾過されたコンバージェントビームの電子 difraktion である.

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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis07:24

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