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Updated: Feb 26, 2026

Imaging Corrosion at the Metal-Paint Interface Using Time-of-Flight Secondary Ion Mass Spectrometry

Imaging Corrosion at the Metal-Paint Interface Using Time-of-Flight Secondary Ion Mass Spectrometry

Published on: May 6, 2019

高分解能顕微鏡モード二次イオン質量分析イメージング

Yifeng Jia¹, Maria Elena Castellani^1,2, Kieran Cheung¹

¹The Department of Chemistry, The Chemistry Research Laboratory, The University of Oxford, 12 Mansfield Road, Oxford OX1 3TA, United Kingdom.

Analytical chemistry

|February 24, 2026

Abstract:

We report the development of a secondary ion mass spectrometry (SIMS) microscope-mode imaging instrument suitable for a wide range of applications in which high throughput is an advantage. By coupling time-of-flight mass spectrometry with pulsed ion extraction methods, the instrument can provide mass resolutions of m/Δm ∼ 2000 across a mass range of m/z $≳$ 1000. We show that the use of an ion imaging detector with a fast scintillator screen, yielding time-of-flight time resolutions of a few nanoseconds, improves the mass resolution further to m/Δm ∼ 6900. Spatial resolutions of better than 5 μm were also obtained under optimum conditions. We demonstrate the capability of the instrument by imaging atomic and molecular ion species in mouse brain tissue sections, capturing a range of biologically relevant ions, including phospholipid and amino acid fragments, over millimeter length scales within minutes.

キーワード:

二次イオン質量分析イメージングハイスループット質量分解能空間分解能生物組織顕微鏡

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Imaging of Biological Tissues by Desorption Electrospray Ionization Mass Spectrometry

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