溶液処理されたSnO2/SnS2二層膜ベースの堅牢なメモリスタを用いた信頼性の高いニューロモルフィックコンピューティング
Xiuyang Tang1, Xinming Ma1, Sizhu Ha1
1Tianjin Key Laboratory of Organic Solar Cells and Photochemical Conversion, Department of Applied Chemistry, State Key Laboratory of Crystal Materials, Tianjin Key Laboratory of Functional Crystal Materials, Institute of Functional Crystals, School of Integrated Circuit Science and Engineering, Tianjin University of Technology, No. 391 Binshui Xidao, Xiqing District, Tianjin 300384, P. R. China. caigangri@sina.com.
Abstract:
The development of scalable, low-power, and high-density resistive memory devices is crucial for next-generation computing architectures, particularly in neuromorphic applications. Here, we report solution-processed SnO2/SnS2 bilayer thin films as functional layers for memristors and synaptic devices. The incorporation of the SnO2 layer enables the formation of oxygen-vacancy conductive filaments that act as virtual electrodes, which effectively guide the nucleation and rupture of sulfur-vacancy filaments in the two-dimensional (2D) SnS2 layer. This synergistic mechanism significantly enhances resistive switching performance, yielding an ON/OFF ratio exceeding 200, stable endurance over 104 cycles, and robust retention. Beyond conventional memory behavior, the bilayer devices emulate essential synaptic functions, including excitatory postsynaptic current (EPSC), paired-pulse facilitation (PPF), and spike-timing dependent plasticity (STDP), and achieve ∼93% inference accuracy in artificial neural network tasks.


