透過焦点走査型偏光顕微鏡によるナノ粒径決定

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Updated: Aug 7, 2026

Utilization of Plasmonic and Photonic Crystal Nanostructures for Enhanced Micro- and Nanoparticle Manipulation

Utilization of Plasmonic and Photonic Crystal Nanostructures for Enhanced Micro- and Nanoparticle Manipulation

Published on: September 27, 2011

Wenhui Zhou, Chunjie Zhai, Zhaolou Cao

|February 27, 2026

Abstract:

Accurate qualitative and quantitative characterization of sub-micron nanoparticles with a high efficiency is highly desirable across a wide range of scientific and industrial applications. In this study, we introduce through-focus scanning polarized microscopy (TSPM) for the estimation of nanoparticle parameters, where physical properties of nanoparticles are related to in-focus and out-of-focus polarization-resolved images. The feasibility of TSPM is rigorously demonstrated through a combination of numerical simulation and experimental measurements. Owing to its practical advantages, TSPM is anticipated to emerge as a powerful and versatile tool for highly sensitive metrology of nanoscale objects in material sciences and semiconductor industries.

キーワード:

ナノ粒子特性評価透過焦点走査型偏光顕微鏡 TSPM 偏光光学顕微鏡ナノテクノロジー材料科学半導体産業

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An Innovative Method for Exosome Quantification and Size Measurement

An Innovative Method for Exosome Quantification and Size Measurement

Published on: January 17, 2015

Performing Spectroscopy on Plasmonic Nanoparticles with Transmission-Based Nomarski-Type Differential Interference Contrast Microscopy

Performing Spectroscopy on Plasmonic Nanoparticles with Transmission-Based Nomarski-Type Differential Interference Contrast Microscopy

Published on: June 5, 2019

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Overview of Electron Microscopy

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.

Overview of Microscopy Techniques

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...