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関連する概念動画

X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...
Confocal Fluorescence Microscopy01:16

Confocal Fluorescence Microscopy

Confocal microscopy is an advanced microscopic technique. The prime advantage of the confocal microscope over other microscopy techniques is its ability to block the out-of-focus light from the illuminated samples using pinholes. It is widely used with fluorescence optics to obtain high-resolution, sharp contrast images. Unlike optical microscopes, confocal microscopes use a focused beam of light laser to scan the entire sample surface at different z-planes. These microscopes are, therefore,...
Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...

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関連する実験動画

Updated: May 29, 2026

Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography
08:51

Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography

Published on: May 26, 2008

シンクロトロン放射線を用いたスキャニングX線顕微鏡.

P Horowitz, J A Howell

    Science (New York, N.Y.)
    |November 10, 1972
    PubMed
    まとめ
    この要約は機械生成です。

    新しいスキャニングX線顕微鏡は,焦点を合わせたシンクロトロン放射線を使用して,空気中の厚いサンプルを3Dで元素特異の画像を作成します. この進歩は,真空の要求なしに材料の詳細な分析を可能にします.

    さらに関連する動画

    Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
    08:46

    Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages

    Published on: April 13, 2016

    Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
    10:12

    Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

    Published on: June 19, 2018

    関連する実験動画

    Last Updated: May 29, 2026

    Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography
    08:51

    Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography

    Published on: May 26, 2008

    Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
    08:46

    Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages

    Published on: April 13, 2016

    Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
    10:12

    Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

    Published on: June 19, 2018

    科学分野:

    • マテリアルサイエンス 材料科学
    • 顕微鏡による顕微鏡検査
    • 物理 物理学 物理学とは

    背景:

    • 従来の顕微鏡は,しばしば真空環境を必要とし,特定のサンプルの分析を制限します.
    • 元素特異的なイメージングは,材料の組成に関する重要な情報を提供します.

    研究 の 目的:

    • 厚いサンプルを分析できるスキャニングX線顕微鏡を開発する.
    • 大気環境における立体鏡および要素差別画像を可能にする.

    主な方法:

    • 集中したシンクロトロン放射を利用した.
    • 集中したビームを作成するために,コリマーションのためのピンホールを使用しました.
    • 画像取得のためのスキャンメカニズムを開発した.

    主要な成果:

    • スキャニングX線顕微鏡を成功裏に構築した.
    • 立体鏡画像処理能力を達成しました.
    • 厚い標本のための要素差別画像生成が実証されています.
    • 大気中の環境で顕微鏡を操作しました.

    結論:

    • 開発されたスキャニングX線顕微鏡は,厚いサンプルを分析するのに有効です.
    • 空気中でのイメージングは,サンプル準備を簡素化し,アプリケーションの範囲を拡大します.
    • このテクニックは,3D要素マッピングのための新しいアプローチを提供します.