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Updated: Jul 26, 2026

Scanning-probe Single-electron Capacitance Spectroscopy
10:53

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

スキャニングシングル電子トランジスタ顕微鏡:個々の電荷のイメージング

Yoo1, Fulton, Hess

  • 1Lucent Technologies, Bell Laboratories, Murray Hill, NJ 07974, USA.

Science (New York, N.Y.)
|April 25, 1997
PubMed
まとめ

新しい単電子トランジスタスキャニング電極計は,100nm解像度で電場をマッピングします. この高度な顕微鏡技術により,ナノスケールでの充電部位と半導体特性を視覚化できます.

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Studying Dynamic Processes of Nano-sized Objects in Liquid using Scanning Transmission Electron Microscopy

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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

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