Jove
Visualize
联系我们
JoVE
x logofacebook logolinkedin logoyoutube logo
关于 JoVE
概览领导团队博客JoVE 帮助中心
作者
出版流程编辑委员会范围与政策同行评审常见问题投稿
图书馆员
用户评价订阅访问资源图书馆顾问委员会常见问题
研究
JoVE JournalMethods CollectionsJoVE Encyclopedia of Experiments存档
教育
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab Manual教师资源中心教师网站
使用条款与条件
隐私政策
政策

相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

您也可能阅读

相关文章

通过共同作者、期刊和引用图与本文相关的文章。

排序
Same author

Synchronization of hyperchaotic harmonics in time-delay systems and its application to secure communication

Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics·2001
Same author

Liquid-solid transition of hard spheres under gravity

Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics·2001
Same author

Characterization of microsatellite loci in the eastern oyster, crassostrea virginica

Molecular ecology·2000
Same author

Phase synchronization and noise-induced resonance in systems of coupled oscillators

Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics·2000
Same author

Nonlocal electron kinetics in a planar inductive helium discharge

Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics·2000
Same author

Left Ventricular Mapping and Myocardial Revascularization.

Current interventional cardiology reports·2000

相关实验视频

Updated: Jul 18, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
05:57

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Published on: April 1, 2020

一个具有并行和串行写作能力的纳米图谱仪.

Hong1, Mirkin

  • 1Department of Chemistry and Northwestern University Center for Nanofabrication and Molecular Self-Assembly, Northwestern University, 2145 Sheridan Road, Evanston, IL 60208, USA.

Science (New York, N.Y.)
|June 10, 2000
PubMed
概括

一个八笔纳米绘图器可以实现并行滴笔纳米光刻 (DPN),显著增加图案的速度. 这个系统使用一个活跃的尖端来引导被动的尖端,以高效,大规模的纳米结构制造.

科学领域:

  • 纳米技术纳米技术
  • 材料科学 材料科学 材料科学
  • 表面科学是一门学科.

背景情况:

  • 滴笔纳米光刻法 (DPN) 是一个有价值的技术,用于纳米尺度的图案.
  • 对于高吞吐量应用程序来说,扩展DPN仍然是一个挑战.

研究的目的:

  • 开发一个八笔纳米绘图器,用于并行笔纳米光刻.
  • 为了证明在DPN中增强的模式速度和可扩展性.

主要方法:

  • 设计并实施了一个八笔纳米图纸系统.
  • 使用一个单一的"成像"尖端与反控制的模式写作.
  • 使用其他七个尖端的被动复制模式.

主要成果:

  • 成功演示了八笔并行写作能力.
  • 集成的墨水和冲洗井可供连续运行.
  • 展示了使用纳米绘图器产生的结构的"分子腐蚀".

结论:

  • 开发的八笔纳米绘图器显著提高了DPN吞吐量.
  • 这种平行DPN方法适用于大面积,高速的纳米结构制造.

更多相关视频

High-Speed Magnetic Tweezers for Nanomechanical Measurements on Force-Sensitive Elements
08:50

High-Speed Magnetic Tweezers for Nanomechanical Measurements on Force-Sensitive Elements

Published on: May 12, 2023

A Multimodal Wide-Field Fourier-Transform Raman Microscope
06:48

A Multimodal Wide-Field Fourier-Transform Raman Microscope

Published on: December 30, 2025

相关实验视频

Last Updated: Jul 18, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
05:57

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Published on: April 1, 2020

High-Speed Magnetic Tweezers for Nanomechanical Measurements on Force-Sensitive Elements
08:50

High-Speed Magnetic Tweezers for Nanomechanical Measurements on Force-Sensitive Elements

Published on: May 12, 2023

A Multimodal Wide-Field Fourier-Transform Raman Microscope
06:48

A Multimodal Wide-Field Fourier-Transform Raman Microscope

Published on: December 30, 2025

  • 该系统为纳米级组装和设备制造提供了新的可能性.