Doron-Mor1, Hatzor, Vaskevich

  • 1Department of Materials and Interfaces, Weizmann Institute of Science, Rehovot, Israel.

Nature
|August 10, 2000
PubMed
概括

这项研究引入了受控表面充电,一种新的,非破坏性的X射线光电子光谱 (XPS) 方法,用于精确的纳米尺度深度分析薄材料层. 该技术准确地确定了介面镜异构结构中的原子位置.

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