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Updated: Jul 13, 2026

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
07:50

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Published on: July 17, 2015

通过共振电子注射对绝缘钻石进行原子尺度成像

K Bobrov1, A J Mayne, G Dujardin

  • 1Laboratoire de Photophysique Moléculaire, Université Paris-Sud, Orsay, France.

Nature
|October 12, 2001
PubMed
概括

研究人员开发了一种新的扫描道显微镜 (STM) 方法,用于成像绝缘钻石表面. 这种技术揭示了原子级电子特性,为设计纳米级电子设备提供了新的可能性.

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相关概念视频

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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