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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

材料研究协会会议. 组装超小型和超敏感的东西

R F Service

    Science (New York, N.Y.)
    |December 26, 2001
    PubMed
    概括

    No abstract available in PubMed .

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