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Updated: Aug 4, 2026

Preparation of Macroporous Epitaxial Quartz Films on Silicon by Chemical Solution Deposition
07:37

Preparation of Macroporous Epitaxial Quartz Films on Silicon by Chemical Solution Deposition

Published on: December 21, 2015

用原子力显微镜研究的石晶体生长

Jonathan R Agger1, Noreen Hanif, Colin S Cundy

  • 1UMIST Centre for Microporous Materials, P.O. Box 88, Manchester M60 1QD, UK. j.agger@umist.ac.uk

Journal of the American Chemical Society
|January 16, 2003
PubMed
概括

原子力显微镜揭示了石晶体中明显的生长模式. 缺陷影响了晶体形态和生长机制,影响了石催化研究.

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相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...