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Updated: Jul 14, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

半导体行业:切割进入

Geoff Brumfiel

    Nature
    |October 8, 2004
    PubMed
    概括

    No abstract available in PubMed .

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    Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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    Published on: December 5, 2015

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