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Thermal Measurement Techniques in Analytical Microfluidic Devices
08:29

Thermal Measurement Techniques in Analytical Microfluidic Devices

Published on: June 3, 2015

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Andrew Watson

    Science (New York, N.Y.)
    |November 20, 2004
    PubMed
    概括

    No abstract available in PubMed .

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    Thermal Measurement Techniques in Analytical Microfluidic Devices
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    Thermal Measurement Techniques in Analytical Microfluidic Devices

    Published on: June 3, 2015

    Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
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    Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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