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Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
Mass Analyzers: Overview01:13

Mass Analyzers: Overview

The mass analyzer is a crucial component of the mass spectrometer. In the ionization chamber, the vaporized sample is bombarded with a high-energy electron beam to generate a radical cation and further fragment into neutral molecules, radicals, and cations. A series of negatively charged accelerator plates accelerate the cations into the mass analyzer. The mass analyzer separates ions according to their mass-to-charge (m/z) ratios and then directs them to the detector. The common types of mass...
Atomic Spectroscopy: Absorption, Emission, and Fluorescence01:23

Atomic Spectroscopy: Absorption, Emission, and Fluorescence

Atomic spectroscopy is a vital tool in elemental analysis, both qualitatively and quantitatively. It can be broadly divided into optical spectroscopy, mass spectroscopy, and X-ray spectroscopy methods. The optical spectroscopic methods are atomic absorption spectroscopy (AAS), atomic emission spectroscopy (AES), and atomic fluorescence spectroscopy (AFS). The first step in all three methods is atomization, where the solid, liquid, or solution-phase samples are converted into gas-phase atoms and...
Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.

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相关实验视频

Updated: Jul 9, 2026

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
06:53

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−

Published on: July 27, 2018

真正的原子分辨率通过原子力显微镜通过排斥和吸引力.

F Ohnesorge, G Binnig

    Science (New York, N.Y.)
    |June 4, 1993
    PubMed
    概括

    原子力显微镜揭示了水中的石裂变平面的原子细节. 这项研究实现了真正的原子分辨率,识别了缺陷并测量了原子间力,以进行增强的表面分析.

    科学领域:

    • 材料科学 材料科学 材料科学
    • 表面科学是一门学科.
    • 纳米技术 纳米技术

    背景情况:

    • 在原子层面了解晶体表面对于预测材料特性和行为至关重要.
    • 石 (碳酸) 是一种常见的矿物质,具有重要的地质和工业应用.
    • 之前对石裂变平面的研究在水性环境中缺乏真正的原子尺度分辨率.

    研究的目的:

    • 用原子力显微镜 (AFM) 在水环境中研究石的 (1014) 分裂平面.
    • 在石表面上实现和展示真正的横向原子尺度分辨率.
    • 描述原子尺度的特征,包括步线和缺陷,并测量原子间的力.

    主要方法:

    • 原子力显微镜 (AFM) 用于成像石 (1014) 分裂平面.
    • 实验是在室温的脱离离子水中进行的,以模仿自然条件.
    • 进行了高分辨率成像和力测量,以分析表面地形和相互作用.

    主要成果:

    • 在石 (1014) 表面上成功实现了真正的横向原子尺度分辨率.
    • 精确确定了原子尺度周期和单元细胞内的原子的相对位置.
    • 解决了原子尺度的扭曲,被确定为沿单原子步线的点状缺陷,得到了解决.

    更多相关视频

    Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
    07:24

    Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

    Published on: May 10, 2021

    Picometer-Precision Atomic Position Tracking through Electron Microscopy
    15:04

    Picometer-Precision Atomic Position Tracking through Electron Microscopy

    Published on: July 3, 2021

    相关实验视频

    Last Updated: Jul 9, 2026

    Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
    06:53

    Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−

    Published on: July 27, 2018

    Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
    07:24

    Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

    Published on: May 10, 2021

    Picometer-Precision Atomic Position Tracking through Electron Microscopy
    15:04

    Picometer-Precision Atomic Position Tracking through Electron Microscopy

    Published on: July 3, 2021

  • 直接测量了样本原子位点和AFM尖端之间的10^-11N级的吸引力.
  • 结论:

    • 水中的AFM提供了无与伦比的原子尺度分辨率,用于像石这样的有序表面.
    • 该研究成功地发现了原子尺度上的缺陷,并测量了原子间的力,验证了该技术.
    • 这种高分辨率成像和力测量能力为表面分析和缺陷表征提供了可靠的方法.