相关实验视频

Updated: Jul 12, 2026

Atomically Traceable Nanostructure Fabrication
12:35

Atomically Traceable Nanostructure Fabrication

Published on: July 17, 2015

现场诱导的纳米到原子尺度操纵表面的STM

I W Lyo, P Avouris

    Science (New York, N.Y.)
    |July 12, 1991
    PubMed
    概括

    研究人员现在可以使用扫描道显微镜 (STM) 在室温下精确地移动原子. 这一突破使得通过受控的原子操纵能够创建新的纳米电子设备.

    更多相关视频

    Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics13:58

    Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

    Published on: September 28, 2016

    Microscopic Visualization of Porous Nanographenes Synthesized through a Combination of Solution and On-Surface Chemistry08:18

    Microscopic Visualization of Porous Nanographenes Synthesized through a Combination of Solution and On-Surface Chemistry

    Published on: March 4, 2021

    相关概念视频

    Atomic Force Microscopy01:08

    Atomic Force Microscopy

    Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
    The AFM Probe
    The probe is regarded as the heart of any AFM setup and comprises the...