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Science (New York, N.Y.)
|March 22, 1991
PubMed
概括

新的近场探测器显著提高了光学显微镜的分辨率和信号强度,使得分衍射成像成为可能. 这一突破将光学表征与纳米空间分辨率相结合,用于先进的材料分析.

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