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原子力显微镜的原子尺度的 ledges 和蚀刻坑在石英溶解过程中形成的石英

A J Gratz, S Manne, P K Hansma

    Science (New York, N.Y.)
    |March 15, 1991
    PubMed
    概括

    原子力显微镜在石英溶解过程中揭示了纳米尺度的边缘和脱位坑. 这证实了酸盐晶体生长和溶解动力学的边缘运动模型.

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    Atomic Force Microscopy

    Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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