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Updated: Jul 11, 2026

Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers
10:15

Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers

Published on: July 22, 2015

用原子力显微镜检查兰格穆尔-布洛杰特薄膜

D K Schwartz, R Viswanathan, J A Zasadzinski

    Science (New York, N.Y.)
    |February 25, 1994
    PubMed
    概括

    No abstract available in PubMed .

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    相关概念视频

    Atomic Force Microscopy01:08

    Atomic Force Microscopy

    Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
    The AFM Probe
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