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Updated: Jul 11, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

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Published on: January 19, 2018

扫描道显微镜的电沉积陶超级网

J A Switzer, R P Raffaelle, R J Phillips

    Science (New York, N.Y.)
    |December 18, 1992
    PubMed
    概括

    扫描道显微镜揭示了--氧陶超的组成变化. 潜在静态沉积比静态方法更好地控制了层组成,影响了超晶格结构.

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    Scanning Electron Microscopy01:07

    Scanning Electron Microscopy

    A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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