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相关概念视频

Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.
Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...

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相关实验视频

Updated: Jun 23, 2026

A TIRF Microscopy Technique for Real-time, Simultaneous Imaging of the TCR and its Associated Signaling Proteins
16:10

A TIRF Microscopy Technique for Real-time, Simultaneous Imaging of the TCR and its Associated Signaling Proteins

Published on: March 22, 2012

射频扫描道挖掘显微镜

U Kemiktarak1, T Ndukum, K C Schwab

  • 1Department of Physics, Boston University, Boston, Massachusetts 02215, USA.

Nature
|November 2, 2007
PubMed
概括

这项研究通过测量来自共振电路的反射信号,将扫描道显微镜 (STM) 的时间分辨率提高到10 MHz. 这一突破使得更快的表面成像和敏感的纳米尺度测量成为可能.

科学领域:

  • 物理 物理学 物理
  • 材料科学 材料科学 材料科学
  • 纳米技术纳米技术

背景情况:

  • 扫描道显微镜 (STM) 提供原子级分辨率.
  • STM的一个主要限制是由于高频响应受到限制,其时间分辨率较低.
  • 现有的STM技术与快速动态过程和微妙的纳米尺度测量作斗争.

研究的目的:

  • 为了克服扫描道显微镜中的时间分辨率限制.
  • 为了实现更快的表面地形采集和先进的纳米尺度测量.
  • 开发一种能够运行高带宽的无线电频率STM.

主要方法:

  • 测量来自嵌入道连接处的共振感应电容电路的反射.
  • 使用无线电频率技术来增强道当前读出带宽.
  • 在道十字路口进行宽带噪声测量.

主要成果:

  • 实现了高达10MHz的电子带宽,这是100倍的改进.
  • 启用了快速的表面地形图像成像.
  • 已证明纳米级温度计和高频机械运动检测具有高灵敏度 (15 fm Hz(-1/2)).

结论:

更多相关视频

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Real-Time, Two-Color Stimulated Raman Scattering Imaging of Mouse Brain for Tissue Diagnosis
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Real-Time, Two-Color Stimulated Raman Scattering Imaging of Mouse Brain for Tissue Diagnosis

Published on: February 1, 2022

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Last Updated: Jun 23, 2026

A TIRF Microscopy Technique for Real-time, Simultaneous Imaging of the TCR and its Associated Signaling Proteins
16:10

A TIRF Microscopy Technique for Real-time, Simultaneous Imaging of the TCR and its Associated Signaling Proteins

Published on: March 22, 2012

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Real-Time, Two-Color Stimulated Raman Scattering Imaging of Mouse Brain for Tissue Diagnosis
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Real-Time, Two-Color Stimulated Raman Scattering Imaging of Mouse Brain for Tissue Diagnosis

Published on: February 1, 2022

  • 开发的射频STM显著提高了时间分辨率.
  • 这一进步为研究纳米系统中的动态现象开辟了新的可能性.
  • 该技术接近量子有限位置测量,推进纳米尺度计量学.