Updated: Jun 25, 2026

Writing and Low-Temperature Characterization of Oxide Nanostructures
Published on: July 18, 2014
J W Reiner1, F J Walker, C H Ahn
1Department of Applied Physics and Center for Research on Interface Phenomena and Structures, New Haven, CT 06520-8284, USA. james.reiner@yale.edu
No abstract available in PubMed .
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