Alexander Weismann1, Martin Wenderoth, Samir Lounis

  • 1IV Physikalisches Institut, Universität Göttingen, 37077 Göttingen, Germany.

Science (New York, N.Y.)
|March 3, 2009
PubMed
概括

研究人员现在可以使用扫描道显微镜在现实空间中对费米表面进行成像. 这种技术利用地下杂质来揭示电子带结构的局部变化,有助于缺陷映射.

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