用环状暗场电子显微镜进行原子对原子的结构和化学分析
Ondrej L Krivanek1, Matthew F Chisholm, Valeria Nicolosi
1Nion Co., 1102 8th Street, Kirkland, Washington 98033, USA. krivanek@nion.com
Nature
|March 26, 2010
概括
研究人员现在可以使用先进的传输电子显微镜对超薄材料中的每一个原子进行成像和识别. 这一突破允许详细分析六角化等材料中的原子替代和扭曲.
科学领域:
- 材料科学 材料科学 材料科学
- 纳米技术 纳米技术
- 分析化学 分析化学
背景情况:
- 传输电子显微镜 (TEM) 长期以来一直被设想用于原子级成像.
- 偏差校正光学显著提升了TEM能力.
- 解决和识别非周期性,多元素材料中的所有原子仍然是一个挑战.
研究的目的:
- 为了展示超薄材料中的原子对原子成像和化学识别.
- 分析单层六角化 (h-BN) 中的替代缺陷.
- 为了实现直接解决原子规模的结构扭曲.
主要方法:
- 使用偏差校正扫描传输电子显微镜 (STEM) 与环状暗场 (ADF) 成像.
- 在低电压下运行STEM,以提高灵敏度.
- 用密度函数理论 (DFT) 计算进行验证.
主要成果:
- 成功地解决并确定了单层h-BN.每一个原子的化学类型.
- 检测和表征了三种类型的替代缺陷:C在B上,C在N上,和O在N位点上.
- 直接观察到由替换引起的约0.1 Å的平面内扭曲.
结论:
- 现在可以对超薄板中的抗辐射损伤的原子进行原子对原子的结构和化学分析.
- 这种技术为原子尺度缺陷及其对材料结构的影响提供了前所未有的洞察力.
- 这些发现为2D材料和纳米结构的高级表征铺平了道路.
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